Enhanced Surface Modulation of CNT and CN-PS Nanocomposites via Plasma Treatment

Document Type : Original Article

Authors

1 Department of Chemistry, College of Science, Al-Nahrain University, P.O. Box: 64021, Jadriyah, Baghdad, Iraq

2 Department of Mechanical Engineering, College of Engineering, Al-Nahrain University, P.O.Box: 64040, Jadriyah, Baghdad, Iraq

3 Department of Physics, College of Science, Al-Nahrain University, P.O. Box: 64021, Jadriyah, Baghdad, Iraq

4 Medical Physics Department, College of Science, Al-Nahrain University, P.O. Box: 64021, Jadriyah, Baghdad, Iraq

5 Chemical and Petrochemical Research Center, Corporation of Research and Industrial Development, Ministry of Industry and Minerals, P.O. Box: 47182, Baghdad, Iraq

6 Institute of Laser for Postgraduate Studies, University of Baghdad, P.O. Box: 47134, Baghdad, Iraq

7 Department of Physics, College of Science, University of Baghdad, P.O. Box: 47131, Baghdad, Iraq

8 Department of Prosthetics and Orthotics Engineering, College of Engineering and Technologies, Al-Mustaqbal University, P.O. Box: 100, Babylon, Iraq

Abstract

New spectrally nanocomposite films have been developed for high absorption performance. The polystyrene (PS) was dissolved in THF and blended with fixed concentrations of carbon nanotubes (CNT) and carbon nanofibers (CN) (5 wt. % CNT, 5 wt. % CN, and 2.5 wt. % CNT+CN) via the casting technique to produce nanocomposite films. Polymer nanocomposite films have been developed to create an economical coating that reinforces the poly (styrene) matrix. The coating exhibits high absorptivity; the optical properties were computed over a wavelength range of 250-1350 nm at 30 °C. The transmittance and reflectance were decreased, skin depth and optical density were increased, and the absorbance coefficient and dielectric constant were increased. The direct and indirect energy gap (Eg) of the films has decreased from 2.8 to 2.4 eV and from 3.4 to 2.9 eV after adding CNT with CN. The Urbach energy (Eu) has increased from 1.24 to 2.71 eV. The XRD test confirms that the films had amorphous structures. The SEM analysis was used to show the surface morphology of thin films. Consequently, the atomic force microscopy (AFM) measurements indicated an increase in surface roughness (SR) from 5.19 to 14.5 nm for the doped PS thin films, and the root mean square (RMS) roughness increased from 6.65 to 16.6 nm. These modified PS nanocomposite thin films find potential applications in various industries, including air transport components, light-emitting diodes, laser sensors, UV energy shielding, light-harvesting devices, memory devices, and light-conversion technologies. 

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References

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